Refrigerator electron beam ion trap-source

6688116
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Inventors

Schneider, Dieter H. G.
McDonald, Joseph W.

Application #

327272

Filed

Dec-20-2002

Published

Feb-10-2004

Current US Class

062/259.2
062/51.1
062/55.5
062/6
315/500

International Classes

B01D 008/00; F25B 019/00; F25B 009/00; F25D 023/12; H01J 023/00

Field of Search

62/259.2 62/51.1 62/55.5 62/6 315/500

Assignee

Physics & Technology, LLC (Livermore, CA)

Examiners

Doerrler; William C.

Attorney, Agent or Firm

Knobbe, Martens, Olson & Bear, LLP

US Patent References

3999403   Thermal interface f...
4600802   Cryogenic current l...
5045703   Cold trapping app...
5590538   Stacked multistage...
5742217   High temperature s...
5743410   Supraconducting...
6060833   Continuous rotating...

Referenced by:

View Backward References

Other References

Rev. Scl. Instrum, Electron beam ion sources and their development at JINR (invited); E.D. Donets, vol. 61 (1); Jan. 1990, 225-229. Physical Review A; Ion-collision experiments with slow, very highly charged ions extracted from an electron-beam ion trap; D. Schneider et al.; vol. 42, No. 7; Oct. 1, 1990; 3889-3895. Physical Review A; Production of high-charge-state thorium and uranium ions in an electron-beam ion trap; D. Schneider et al.; vol. 44, No. 5; Sep. 1, 1991; 3119-3124. Physics & Technology web site brochure posting 3/02; REBIT/S Refrigerated Electron Beam Ion Trap/Source.

Citation

Cite This Patent

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Abstract
An ion beam producing device employing a refrigeration system to provide the cooling for a superconducting compression magnet at a trap core of an electron beam ion trap (EBIT) without the use of cryogenic liquid gases. The elimination of cryogenic cooling gases, such as liquid helium, is effectuated by the incorporation of cryo-refrigerators having highly thermally conductive cryo-heads, and a super-conducting, solid lead arrangement for energizing the compression magnet, the leads producing little or no heat within the cold shield. The reduction or elimination of use of liquid cooling-gases significantly reduces the size and operating cost of the electron beam source/trap system. A magnetic field line guide-field reduces magnet field-line interference otherwise risked by the reduction in size of the electron beam device.
 
Claims
We claim:

1. An electron beam device for producing ion beams, comprising:

an electron beam source configured to produce an electron beam;

a trap core inline with the electron beam, including a compression magnet configured to compress the electron beam;

a first cooling contact in thermal communication with the trap core;

a refrigerator system configured to cool the trap core by cooling the cooling contact;

a first thermally conductive, solid link between the first cooling contact and the refrigerator system;

a collection magnet inline with the electron beam, the collection magnet located downstream of the compression magnet;

an outer cold shield substantially surrounding the electron beam source, trap core, and collection magnet;



Description
FIELD OF THE INVENTION

The invention relates generally to electron beam ion sources (EBIS), and particularly to an apparatus including a refrigerated electron beam ion trap (EBIT) system which preferably reduces reliance on liquid gases for cooling.

BACKGROUND OF THE INVENTION

An electron beam ion trap (EBIT) is a spin-off development of an electron beam ion source (EBIS). The basic physical principle behind EBIT or EBIS is the trapping of low charge state ions in the space charge potential of the compressed electron beam and the subsequent successive ionization, which produces very highly charged ions depending in range on the electron beam ionization energy. The electron beam is compressed in a coaxial magnetic field (.about.3 Tesla) of a super-conducting magnet. The first operational EBIS was demonstrated in 1967, and the operation of an EBIT as a source was first reported in 1990. In these prior devices, the extracted ion species and charges range from H.sup.+ to Th.sup.80.sup.+ with energies variable between 2 keV to 30 keV per charge. A description of prior electron beam ion sources incorporating an ion trap may be found in Schneider et al., "Ion collision experiments with slow, very highly charged ions extracted from an electron-beam ion trap" Phys. Rev. A 42, 3889 (1990), which is incorporated herein by reference for this purpose.
 
  In a superconducting current limiter 1, in the limiting state pressure waves which may damage the superconductor are produced as a result of the evaporation...  Cryostat having a connecting branch which is connected to a cooling chamber and is open on the end side, raised parts and/or depressions increasing the...