Laser surface treatment

4972061
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Inventors

Duley, Walter W.
Kinsman, Grant

Application #

317261

Filed

Feb-28-1989

Published

Nov-20-1990

Current US Class

219/121.66
219/121.69
219/121.8
219/121.85
427/586
427/596

International Classes

B23K 026/00

Field of Search

219/121.6 219/121.65 219/121.66 219/121.68 219/121.69 219/121.8 219/121.85

Examiners

Albritton; C. L.

Attorney, Agent or Firm

Fleit, Jacobson, Cohn, Price, Holman & Stern

US Patent References

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Referenced by:

View Backward References

Other References

Patent Abstracts of Japan, vol. 7, No. 214 (E-199) (1359), Sep. 21, 1983-Japanese Patent No. 58-106836(A). Patent Abstracts of Japan, vol. 7, No. 286 (P-244) (1431), Dec. 21, 1983-Japanese Patent No. 58-159514(A). Patent Abstracts of Japan, vol. 10, No. 115 (M-474) (2172), Apr. 30, 1986-Japanese Patent No. 60-244495(A). Patent Abstracts of Japan, vol. 7, No. 55 (M-198) (1200), Mar. 5, 1983-Japanese Patent No. 57-202992(A). W. W. Duley, Laser Processing and Analysis of Materials, 1983, pp. 69-78. W. W. Duley, "Laser Material Interactions of Relevance to Metal Surface Treatment," Draper and Mazzoldi (eds.), Laser Surface Treatment of Metals, 1986, pp. 3-16. "Moire Displacement Measurement Technique for a Linear Encoder", 1012 Optics and Laser Technology, to 17 (1985), Apr., No. 2, London, Great Britain. "Collimation Test by Double Grating Shearing Interferometer", Patorski, Yokozeki and Suzuki, Applied Optics, vol. 15, No. 5, May 1976. "Position Monitoring Technique Using Double Diffraction Phenomenon", Optics Communications, vol. 27, No. 3, Dec. 1978.

Citation

Cite This Patent

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Abstract
A method of modifying the reflectivity and emissivity of a surface of a material comprises the steps of irradiating the surface with a beam of coherent pulsed radiation at a power sufficient to generate a surface plasma and scanning said beam across said surface. Successive pulses of radiation are caused to overlap and chemical change at the surface is promoted by provision of a localized atmosphere. The surface produced has features on a scale of less than 50 microns and is restricted to a depth of less than 10.sup.-3 cm. The body of the material is not affected.
 
Claims
We claim:

1. A method of modifying the reflectivity of a surface of a material comprising the steps of:

irradiating the surface with a beam of coherent pulsed radiation, said pulsed radiation being at a power level sufficient to melt the surface and thereby to generate a surface plasma so that the shock wave associated with the surface plasma produces a roughening of said surface; and

repeatedly scanning said beam across said surface to form successive closely spaced lines on said surface as a result of said roughening of said surface.

2. A method according to claim 1 including the step of promoting chemical change at said surface.

3. A method according to claim 2 wherein the chemical change is promoted by providing a localised atmosphere at said surface.



Description
The present invention relates to a method of modifying the reflectivity and/or of a surface of a metal.

Most surfaces reflect radiation over a wide range of wavelengths and do so with a varying reflectivity at different wavelengths. This characteristic can be used in a number of ways and has differing effects. For example, in an armaments environment, a laser is used to interrogate a vehicle and the signature of the vehicle is determined by the reflectivity of the surface. This is used to identify an enemy and the type of vehicle. The emissivity of a surface, which is related physically to the surface reflectivity is also an important parameter in determining the rate with which a surface loses or gains heat by radiation. The emissivity of a surface is for example critical in the cooling of spacecraft where maximum emissivity is desirable to reduce the temperature of the spacecraft and avoid damage to the vehicle. Such surfaces would have a low reflectivity at wavelengths in the infrared.
 
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