Apparatus for growing thin films

5855680
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Inventors

Soininen, Pekka
Patteri, Janne

Application #

682704

Filed

Sep-25-1996

Published

Jan-5-1999

Current US Class

118/719
118/725
118/726

International Classes

C23C 016/00

Field of Search

118/715 118/719 118/725 118/726

Assignee

Neste Oy (Espoo, FI)

Examiners

Bueker; Richard

Attorney, Agent or Firm

Sterne, Kessler, Goldstein & Fox P.L.L.C.

US Patent References

4058430   Method for produci...
4062318   Apparatus for che...
4263872   Radiation heated r...
4339645   RF Heating coil co...
4389973   Apparatus for perfo...
4421786   Chemical vapor de...
4825806   Film forming appa...
4993357   Apparatus for atom...
5038711   Epitaxial facility
5091335   MBE growth techno...
5183510   Apparatus and pro...

Referenced by:

View Backward References

Other References

Garnache et al., "Deposit and Clean Depositin System," IBM Technical Disclosure Bulletin, vol. 13, No. 7, Dec. 1970, p. 2083. Suntola, "Atomic Layer Epitaxy," Thin Solid Films, 216, 1992, pp. 84 -89.

Citation

Cite This Patent

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Abstract
An apparatus for growing thin films onto a substrate by subjecting the substrate to alternately repeated surface reactions of vapor-phase reactants for the purpose of forming a solid-state thin film. The apparatus includes a reaction chamber pack into which the substrate is placed. The apparatus further includes at least two reactant sources, from which the reactants can be fed in the form of gas-phase pulses into the reaction chamber pack. The apparatus further includes reactant inflow channels for connecting the reactant sources to the reaction chamber pack. The reaction chamber pack, the reactant sources and the reactant inflow channels are all placed inside the same pressure shell. The reaction chamber pack and the reactant sources are each provided with individual heaters, which heat the reaction chamber pack and each reactant source, so that each heater is independently controllable from each other. Further, active thermal insulation elements thermally isolate the heaters from each other. These active thermal insulation elements are capable of controlling the internal temperature of the pressure shell independently from the temperatures of the reactant sources and the reaction chamber pack. The apparatus allows the temperatures of the reactant sources and the reaction chamber pack to be rapidly elevated and lowered, respectively, with low heat loss.
 
Claims
What is claimed is:

1. An apparatus for growing compound thin films onto a substrate by subjecting the substrate to alternately repeated surface reactions of vapor-phase reactants for the purpose of forming a solid-state thin film, said apparatus comprising:

a reaction chamber pack into which the substrate can be placed;

a plurality of reactant sources from which the vapor-phase reactants used in a thin-film growth process can be fed in the form of gas-phase pulses into said reaction chamber pack; and

a plurality of reactant inflow channels suited for connecting said reactant sources to said reaction chamber pack, wherein said reaction chamber pack, said reactant sources and said reactant inflow channels are all placed inside a pressure shell, and wherein said reaction chamber pack and said reactant sources are each provided with individual heating means for heating said reaction chamber pack and each of said reactant sources in a fashion independently controllable from each other, and wherein said heating means has a plurality of heatable components which are isolated from each other using active thermal insulation elements.



Description
BACKGROUND OF THE INVENTION

1. Background of the Invention

The present invention relates to an apparatus according to the preamble of claim 1 for growing thin films on a substrate, in which apparatus the substrate is subjected to alternately repeated surface reactions of vapor-phase reactants for the purpose of forming a solid-state thin film on the substrate through said surface reactions.

The apparatus comprises a reaction chamber pack into which the substrate can be placed, at least two reactant sources from which the reactants used in the thin-film growth process can be fed in the form of vapor-phase pulses into the reaction chamber pack, reactant inflow channels suited for connecting the reactant sources to the reaction chamber pack, and outflow channels connected to the reaction chamber pack suited for removing the gaseous reaction products of the growth process and the excess reactants.

2. Related Art

Conventionally, thin-films are grown using vacuum evaporation deposition, the Molecular Beam Epitaxy (MBE) and other vacuum deposition methods, different variants of the Chemical Vapor Deposition (CVD) method (including low-pressure and metal-organic CVD and plasma-enhanced CVD), or alternatively, the above-described deposition method of alternately repeated surface reactions called the Atomic Layer Epitaxy method, or in short, ALE. In the MBE and CVD methods, the growth-rate-affecting process variables also include the concentrations of the starting material inflows. To achieve a uniform thickness of the layers deposited by the first category of conventional methods, the concentrations and reactivities of starting materials must be carefully kept constant all over the substrate area. If the starting materials are allowed to mix with each other prior to reaching the substrate surface as is the case in the CVD method, for instance, a chance of their mutual reaction arises. Then, the risk of microparticle formation already within the inflow channels ol the gaseous reactants is imminent. Such microparticles have a deteriorating effect on the quality of the thin film growth. Therefore, the possibility of premature reactions in MBE and CVD reactors is avoided by heating the starting materials not earlier than at the substrate surfaces. In addition to heating, the desired reaction can be initiated using, e.g., a plasma or other similar activating means.
 
  A semiconductor manufacturing apparatus which enables, inside a vacuum, the transport of and mounting at a prescribed position of a supporting component...  The present invention relates to a reaction apparatus for receiving a reaction gas and for heating a substrate so as to form a film such as an insulating...