Apparatus for growing thin films

6447607
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Inventors

Soininen, Pekka T.
Kilpi, Vaino

Application #

749329

Filed

Dec-27-2000

Published

Sep-10-2002

Current US Class

117/200
117/900
118/719
118/725
118/730
414/217

International Classes

C30B 035/00

Field of Search

117/200 117/900 118/719 118/725 118/730 414/217

Assignee

ASM Microchemistry Oy (Espoo, FI)

Examiners

Hiteshew; Felisa

Attorney, Agent or Firm

Knobbe, Martens, Olson & Bear LLP

US Patent References

4058430   Method for produci...
4389973   Apparatus for perfo...
4694779   Reactor apparatus...
5092728   Substrate loading a...
5288327   Deflected flow in ch...
5525159   Plasma process ap...
5628828   Processing method...
5810538   Semiconductor ma...
5855680   Apparatus for grow...

Referenced by:

View Backward References

Other References

Ald Precursor: Chemistry: Evolution and Future Challenges. Leskela et al. Journal de Physique IV, France 9 (1999). 8-837 to 8-582. Synthesis of Oxide Thin Film and Overlayers by Atomic Layer Epitaxy for Advanced Applications. Niinsto et al.. Materials Science and Engineering B41 (1996). pp. 23-29. Atomic Layer Epitaxy. Tuomo Suntola. Thin Solid Films, 216 (1992). pp. 84-89.

Citation

Cite This Patent

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Abstract
The invention relates to an apparatus for growing thin films onto the surface of a substrate by exposing the substrate to alternately repeated surface reactions of vapor-phase reactants. The apparatus comprises at least one process chamber having a tightly sealable structure, at least one reaction chamber having a structure suitable for adapting into the interior of said process chamber and comprising a reaction space of which at least a portion is movable, infeed means connectable to said reaction space for feeding said reactants into said reaction space, and outfeed means connectable to said reaction space for discharging excess reactants and reaction gases from said reaction space, and at least one substrate adapted into said reaction space. At least one loading chamber is arranged to cooperate with said process chamber so as to permit said reaction space or a portion thereof to be moved into said process chamber and away from said process chamber and, further, the operating pressure of the loading chamber is arranged to be controllable independently from said pressure chamber.
 
Claims
What is claimed is:

1. An apparatus for growing thin films onto the surface of a substrate by exposing the substrate to alternate surface reactions of vapor-phase reactants, the apparatus comprising:

at least one process chamber having a substantially sealed structure;

at least one reaction chamber comprising a reaction space of which at least a portion is movable, an inlet connectable to said reaction space for feeding said reactants into said reaction space, and outlet connectable to said reaction space for discharging excess reactants and reaction gases from said reaction space;

at least one substrate located within said reaction space; and

at least one loading chamber which is in selective communication with said process chamber so as to permit said reaction space or a portion thereof to be moved from said loading chamber into said process chamber and from said process chamber to said loading chamber.



Description
PRIORITY INFORMATION

This application claims the priority benefit under 35 U.S.C. .sctn.119 to Finnish patent application No. 19992798, filed Dec. 28, 1999, the entire content of which is hereby expressly incorporated by reference.

FIELD OF THE INVENTION

The present invention relates to an apparatus according for growing thin films on a surface of a substrate. More particularly, the present invention relates to an apparatus for producing thin films on the surface of a substrate by subjecting the substrate to alternately repeated surface reactions of vapor-phase reactants.

DISCUSSION OF RELATED ART AND SUMMARY OF THE INVENTION

Conventionally, thin-films are grown using vacuum evaporation deposition, the Molecular Beam Epitaxy (MBE) and other similar vacuum deposition methods, different variants of the Chemical Vapor Deposition (CVD) method (including low-pressure and organometallic CVD and plasma-enhanced CVD) or a deposition method of alternately repeated surface reactions called the Atomic Layer Epitaxy (ALE) method or Atomic Layer Deposition (ALD).
 
  The invention provides a vacuum processing apparatus, in which a substantial installation area is smaller than that of a conventional vacuum processing...  A workpiece loading interface is included within a workpiece processing system which processes workpieces, typically wafers, in a vacuum. The workpiece...