Plasma apparatus

4902934
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Inventors

Miyamura, Tadashi
Sugawara, Shigeo

Application #

192130

Filed

May-10-1988

Published

Feb-20-1990

Current US Class

118/715
118/719
118/723MR
118/728
118/729
250/492.2
315/111.21
315/111.71
414/217

International Classes

H01J 007/24; H05B 031/26; C23C 016/00

Field of Search

315/111.01 315/111.21 315/111.31 315/111.71 313/231.31 313/231/51 250/492.2 118/715 118/716 118/719 118/724 118/728 118/729 118/730

Assignee

Sumitomo Metal Industries, Ltd. (Osaka, JP)

Examiners

Laroche; Eugene R.

Attorney, Agent or Firm

Burns, Doane, Swecker & Mathis

US Patent References

4550239   Automatic plasma...
4641060   Method and appar...
4668365   Apparatus and met...
4713585   Ion source
4724300   Temperature contro...

Referenced by:

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Citation

Cite This Patent

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Abstract
A plasma apparatus which is; provided with a pair of plasma generation chambers at both sides of a specimen chamber provided therein with two specimen mounts for fixing specimens to be subjected to the predetermined processing such as plasma CVD; designed to use the specimen chamber in common so as to simultaneously process by plasma generated by the pair of plasma generation chambers the specimens fixed to the two specimen mounts to thereby be compact as a whole; and provided with a load lock chamber communicated with the specimen chamber and delivering the specimens between the load lock chamber and specimen chamber, so that the plurality of specimens are contained in cassettes disposed in the load lock chamber and the contained specimens are moved between the load lock chamber and the specimen chamber by means of a loader provided in the load lock chamber, thereby enabling a rest time to be reduced and the specimen to be efficiently processed.
 
Claims
What is claimed is:

1. A plasma apparatus comprising;

a pair of plasma generation chambers for generating plasma by electron cyclotron resonance excitation utilizing microwaves;

a specimen chamber being provided at both sides thereof with said plasma generation chambers opposite to each other and at the facing positions at both side walls thereof with plasma extraction windows facing said plasma generation chambers; and

a pair of specimen mounts disposed in said specimen chamber, oriented reversely to each other, and opposite to said plasma extraction windows respectively.

2. A plasma apparatus as set forth in claim 1, further comprising a load lock chmber communicating with said specimen chamber through communicating conduits provided at one side wall of said specimen chamber not-opposite to said plasma extraction windows thereat and being provided therein with means for containing therein a plurality of specimens to be supplied to each of said specimen mounts.



Description
BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention realtes to a plasma apparatus utilizing electron cyclotron resonance used as a CVD (chemical vapor deposition) apparatus, an etching apparatus, a sputtering apparatus or the like for manufacturing semiconductor equipments, and more particularly to a plasma apparatus using a specimen chamber in common with respect to two plasma generation chambers.

2. Description of the Prior Art

The plasma apparatus utilizing electron cyclotron resonance (to be hereinafter referred to as ECR) is advantageous in that plasma of high activity can be obtained under low gas pressure, the ion energy can widely be selected, a large ion current is obtained, and an ion flow is superior in directivity and uniformity, and has been promoted in research and development as the apparatus indispensable for manufacture of a high integrated semiconductor apparatus.

FIG. 1 is a longitudinally sectional view of the conventional plasma apparatus utilizing the ECR as the plasma CVD apparatus, in which a plasma generation chamber 31 is shown. The plasma generation chamber 31 is surrounded with double framed walls and provided therebetween with a cooling water flow chamber 31a, at the center of the upper wall with a microwave inlet 31c vacuum-sealed by a quartz glass plate 31b, and at the center of the lower wall with a plasma extraction window 31d opposite to the microwave inlet 31c. A wave guide 32 is connected at one end thereof with the microwave inlet 31c, a reaction chamber 33 as specimen chamber is provided and faces the plasma extraction window 31d, and exciting coils 34 are disposed around and coaxially with the plasma generation chamber 31 and an end portion of the wave guide 32 connected thereto.
 
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