Geometrical transformation identifying system

6671386
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Inventors

Shimizu, Shuichi
Koido, Akioi

Application #

316525

Filed

May-21-1999

Published

Dec-30-2003

Current US Class

235/382
382/100
382/296
382/298
713/176

International Classes

G06K 009/00

Field of Search

382/137 382/232 382/274 382/250 382/280 382/115 382/100 382/298 382/279 382/199 382/266 382/269 382/296 235/382 380/3 380/4 380/54 380/59 380/51 380/55 399/366 399/84 355/201 713/176

Assignee

International Business Machines Corporation (Armonk, NY)

Examiners

Patel; Jayanti K.

Attorney, Agent or Firm

Herzberg; Louis P., Dougherty; Anne V.

US Patent References

5530759   Color correct digita...
5642293   Method and appar...
5644656   Method and appar...
5784490   Method and appar...
5825892   Protecting images...
5859920   Method for embedd...
5949055   Automatic geometri...
6044156   Method for generati...
6057922   Optical testing meth...

Referenced by:

View Backward References

Other References

U.S. patent application Ser. No. 60/117,921, filed Jan. 29, 1999.

Citation

Cite This Patent

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Abstract
A geometrical correction system and method comprising creation of at least one pattern consisting of asymmetric two dimensional waves, embedding at least one pattern consisting of asymmetric two dimensional waves in a real domain, and calculation of at least one geometrical transformation applied by way of extraction of the embedded two dimensional waves. Said creation of at least one pattern consisting of asymmetric two dimensional waves means to calculate a two dimensional wave parameter set for creating at least one pattern adapted for use in the geometrical correction system of this invention. Also, said embedding of at least one pattern consisting of asymmetric two dimensional waves in a real domain means to add the pattern to an original image. Further, said calculation of at least one geometrical transformation applied by way of extraction of the embedded two dimensional waves means to calculate parameters of the embedded two dimensional waves from the image that is subjected to at least one geometrical transformation, to compare these parameters with the two dimensional wave parameter set of the embedded pattern, thereby to identify the geometrical transformation applied to the embedded image.
 
Claims
Having thus described our invention, what we claim as new and desire to secure by Letters Patent is:

1. A two dimensional wave embedding system for embedding two dimensional waves in an image to identify at least one geometrical transformation which has been applied to the image, comprising:

(a) means for storing the image into a storage means;

(b) means for generating and storing at least one pattern, consisting of a set of asymmetric two dimensional waves identifying the at least one geometrical transformation, into the storage means; and

(c) means for embedding said pattern of a set of asymmetric two dimensional waves identifying the at least one geometrical transformation which has been applied to the image in said stored image in a real domain.



Description
FIELD OF THE INVENTION

This invention relates to a method and a system for accurately identifying at least one geometrical transformation applied to an image that has two dimensional waves embedded therein, whenever such an image has been subjected to the geometrically transformation.

BACKGROUND OF THE INVENTION

It is already known in the art that rotation of a space causes distribution of a frequency domain (Fourier Transformed Space) to be rotated as well. While E. De Castro and C. Morandi (IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. PAMI-9, No. 5, pp. 700-703, 1987) apply this principle to geometrical correction (geometrical registration) of a rotated image, nevertheless they do not propose or suggest intentionally embedding two dimensional waves. Rather, they use a method of repetitively searching for a rotational angle that will maximize a correlation in a frequency domain between an original image and a rotated image. Thus, this method inevitably requires use of an original image for the purpose of determining any linear transformations applied thereto.
 
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