Wire bonding method and apparatus

5615821
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Inventors

Sasano, Toshiaki

Application #

429708

Filed

Apr-27-1995

Published

Apr-1-1997

Current US Class

228/102
228/180.5
257/E21.518

International Classes

H01L 021/60

Field of Search

228/7 228/9 228/102 228/4.5 228/180.5

Assignee

Kabushiki Kaisha Shinkawa (Tokyo, JP)

Examiners

Ramsey; Kenneth J.

Attorney, Agent or Firm

Koda and Androlia

US Patent References

5474224   Wire bonder and w...

Referenced by:

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Citation

Cite This Patent

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Abstract
A wire bonding method and apparatus for manufacturing semiconductor devices automatically correcting, after predetermined times of bonding executions, any shifts occurring via heat, etc. in an offset distance set between a capillary through which a bonding wire passes and a camera that takes images of leads of a lead frame and pads of a semiconductor chip.
 
Claims
I claim:

1. A wire bonding method which uses a capillary executing wire bonding on a workpiece consisting of a semiconductor chip installed on a lead frame, a camera having a central axis of workpiece detection which is set to have an offset distance from the capillary, and an XY table which moves the capillary and camera together in X and Y directions, said method performing bonding by detecting an amount of shift of said workpiece via said camera, correcting bonding coordinates accordingly, moving said table by an amount that corresponds to said offset distance, and successively moving said capillary to said corrected bonding coordinates in accordance with a predetermined program, and said method being further characterized in that after an offset correction time has passed since bonding has been performed, said XY table is automatically driven so that said central axis of said workpiece detection of said camera is positioned above a bonded ball or capillary pressure mark, a positional shift of said ball or capillary pressure mark is detected, said shift in said offset is corrected accordingly, and said offset correction time is decreased during operational time periods when large fluctuations in said offset distance are predicted and increased during operational time periods when small fluctuations in said offset distance are predicted.



Description
BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a wire bonding method and apparatus and more particularly to a wire bonding method and apparatus that includes a means for correcting the positional offset between a workpiece imaging camera and a capillary.

2. Prior Art

As shown in FIG. 4, in a workpiece 3 which comprises a semiconductor chip 2 installed on a lead frame 1, wires 4 are used for connecting the pads P.sub.1, P.sub.2 . . . of a semiconductor chip 2 and the leads L.sub.1, L.sub.2 . . . of a lead frame 1. The connection between the pads and the leads are done by a wire bonding apparatus as shown, for example, in FIG. 5.

Generally, in wire bonding between the pads and leads, any positional shift or discrepancy between them from predetermined positions is first detected at at least two points on the semiconductor chip 2 and at least two points on the lead frame 1 by a camera 11, and the bonding coordinates for the pads and leads stored beforehand in the bonding apparatus are corrected based upon the detected result.
 
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