Wire bonding method

5961029
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Inventors

Nishiura, Shinichi
Mochida, Tooru

Application #

005789

Filed

Jan-12-1998

Published

Oct-5-1999

Current US Class

228/1.1
228/110.1
228/180.5
257/E21.518

International Classes

B23K 031/02; B23K 001/06

Field of Search

228/180.5 228/110.1 228/1.1 228/4.5 228/102 219/56.1 219/56.22 219/56.21 140/112

Assignee

Kabushiki Kaisha Shinkawa (Tokyo, JP)

Examiners

Ryan; Patrick

Attorney, Agent or Firm

Koda & Androlia

US Patent References

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Citation

Cite This Patent

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Abstract
A method for connecting a first bonding point and a second bonding point with a wire comprising the steps of: raising a capillary through which the wire passes slightly after the second reverse operation that involves the movement of the capillary in the opposite direction from a second bonding point, moving the capillary to a position which is more or less above the first bonding pint, and then raising the capillary while delivering the wire; resulting in the formation of a kink in the inclined portion of a trapezoidal wire loop employed in the wire connection in semiconductor devices.
 
Claims
What is claimed is:

1. A wire bonding method wherein a first bonding point and a second bonding point are connected by a wire, the method comprising the steps of:

connecting a wire to a first bonding point;

performing a first reverse operation in which said capillary is raised slightly and then caused to move slightly in the opposite direction from said second bonding point;

performing a second reverse operation in which said capillary is raised and then caused to move in the opposite direction from said second bonding point;

raising said capillary and then moving said capillary toward said second bonding point; and

performing a process in which said capillary is raised delivering said wire from said capillary, after which said capillary is moved toward said second bonding point and then said wire is connected to said second bonding point.



Description
BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a wire bonding method for connecting a first bonding point and a second bonding point with a wire in a semiconductor device manufacturing process, and more particularly to a loop formation method in such a bonding method.

2. Prior Art

As shown in FIG. 4(a) and 4(b), in a semiconductor device, a pad 2a (first bonding point) on a semiconductor chip 2 mounted on a lead frame 1 and a lead 1a (second bonding point) on the lead frame 1 are connected by a bonding wire (called merely "wire") 3. The loop shape of the wire 3 in this case may be a trapezoidal loop shape as shown in FIG. 4(a) or a triangular loop shape as shown in FIG. 4(b).

Wire loop formation methods of this type are described in, for example, Japanese Patent Application Publication (Kokoku) No. 5-60657 and Japanese Patent Application Laid-Open (Kokai) No. 4-318943.

The trapezoidal loop shown in FIG. 4(a) is formed by the process shown in FIG. 5.
 
  The wire bonding method of the present invention comprises a step of removing a thin surface layer of an electrode comprising a copper layer and a nickel...  A method for moving a capillary so as to connect wire to a first bonding point and then to a second bonding point in manufacturing, for instance, semiconductor...